Group by: Item Type | No Grouping Jump to: Article Number of items: 1. ArticleGhosh, J and Chattopadhayay, S K and Meikap, A K and Chatterjee, S K (2008) Microstructure characterization of titanium-base aluminium alloys by X-ray diffraction using Warren-Averbach and Rietveld method. Journal of Alloys and Compounds, 453 (1-2). pp. 131-137. ISSN 0925-8388 |