Ghosh, J and Chattopadhayay, S K and Meikap, A K and Chatterjee, S K (2008) Microstructure characterization of titanium-base aluminium alloys by X-ray diffraction using Warren-Averbach and Rietveld method. Journal of Alloys and Compounds, 453 (1-2). pp. 131-137. ISSN 0925-8388

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Present study considers microstructural characterization of titanium-base aluminium (Ti-Al) alloys, which are widely used in the aviation industry due to its excellent combination of strength and ductility. The microstructural parameters like domain size, microstrain within the domain, dislocation density and stacking fault probabilities have been evaluated in hexagonal Ti-Al alloys having four different nominal compositions in at.% by X-ray diffraction Fourier line profile analysis using Warren-Averbach and Rietveld method taking silicon as standard. This analysis shows that the deformation growth faults beta are totally absent in this hexagonal system, because it has been observed to be either negligibly small (within experimental error) or negative. This analysis also reveals that the tendency for deformation faulting alpha increases by the addition of aluminium as solute and hence lowers its stacking fault energy. (C) 2006 Elsevier B.V. All rights reserved.

Item Type: Article
Uncontrolled Keywords: X-ray diffraction; metals and alloys; microstructure; Warren-Averbach; rietveld method
Subjects: Microstructure and Characterization
Depositing User: Bula Ghosh
Date Deposited: 17 Jan 2012 10:54
Last Modified: 26 May 2016 05:13

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