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Ghosh, J and Chattopadhayay, S K and Meikap, A K and Chatterjee, S K (2008) Microstructure characterization of titanium-base aluminium alloys by X-ray diffraction using Warren-Averbach and Rietveld method. Journal of Alloys and Compounds, 453 (1-2). pp. 131-137. ISSN 0925-8388
