Sekh, Md Asraful and Sood Biswas, Nisha and Sarkar, Samir and Basuray, Amitabha (2013) Measurement of gradient index profile using deflectometry. Optics Communications, 306. pp. 145-149. ISSN 0030-4018

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Abstract

The present paper reports a simple technique for measurement of one dimensional graded index (GRIN) profile using deflectometry. In this method the linear fringe pattern generated by a lateral shear interferometer using a Wollaston prism is made incident on the GRIN sample and the profile is measured from the deflection of the fringes. The method is simple and also gives a visual display of the GRIN profiles. Computation of the profile from the deflection of fringes is also simple. Measured data is compared with the theoretical ones obtained from the solution of the diffusion equation. Results are reported for negative refractive index profiles made by exchanging Na+ for Li+ ions in Na2O-Li2O-Al2O3-ZrO2-SiO2 glasses. (C) 2013 Elsevier B.V. All rights reserved.

Item Type:	Article
Subjects:	Microstructure and Characterization
Divisions:	Glass
Depositing User:	Bidhan Chaudhuri
Date Deposited:	05 Feb 2014 11:41
Last Modified:	12 Mar 2016 14:58
URI:	http://cgcri.csircentral.net/id/eprint/2477

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