Bhattacharya, D and Maiti, Himadri Sekhar and Das, G C (1997) Role of superconductor normal metal superconductor proximity junctions in governing the intergranular flux pinning in electrophoretically deposited Y-Ba-Cu-O films. Japanese Journal Of Applied Physics Part 1-Regular Papers Short Notes & Review Papers , 36 (2). pp. 669-673. ISSN 0021-4922

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Abstract

Within a low-field limit, the magnetic critical current density (J(c)) is found to have dropped drastically in case of thinner Y-Ba-Cu-O films (less than or equal to 20 mu m); deposited electrophoretically on silver substrates. In this low-field limit, the current loops scale the entire sample volume consisting of grain-grain-boundary networks. Due to the presence of uniformly distributed silver at the grain boundaries within the entire network (in case of these thinner films), the pinning potential (U-0) of the grain boundary Josephson vortices is small as it depends on random variation in Josephson coupling energy (E(J)) of the grain boundaries. In case of thicker films, of course, U-0 can be high as no silver penetration is possible up to the top layers and hence, U-0 varies as similar to d(0.4) (d=film thickness) and ranges from 45 to 135 meV over a thickness regime of 3-65 mu m. Consequently, the magnetic J(c) too, follows an anomalous trend of variation with film thickness.

Item Type:	Article
Uncontrolled Keywords:	magnetic critical current density; thickness dependence; effective barrier height; proximity junctions
Subjects:	Electronics
Divisions:	UNSPECIFIED
Depositing User:	Bidhan Chaudhuri
Date Deposited:	17 Jul 2012 06:56
Last Modified:	15 May 2016 13:14
URI:	http://cgcri.csircentral.net/id/eprint/1597

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