Singh, Vipin Kumar and Kandulna, Nelson and Pal, Prabir and Saha, Subho (2026) Growth and Structural Evolution of Ultrathin LaAlO3 Films on Al2O3 (0001) via Pulsed Laser Deposition. Materials Letters, 421 (141056). ISSN 0167-577X
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This study reports the first direct growth of ultrathin LaAlO3 films on Al2O3 (0001) using pulsed laser deposition. Despite significant lattice and symmetry mismatches between the perovskite LaAlO3 and the trigonal sapphire substrates, in situ reflection high-energy electron diffraction confirms single-crystalline films with predominantly two-dimensional (2D) growth. Atomic force microscopy confirms uniform 2D growth, while ex-situ in vacuum annealing at 900°C shows grain coarsening and uniform island formation of the film. X-ray photoelectron spectroscopy demonstrates the absence of interdiffusion at the LaAlO3/Al2O3 (0001) interface, even after high-temperature annealing (900°C). These findings establish Al2O3 (0001) as a thermally stable substrate for the direct 2D growth of ultrathin LaAlO3 films, providing a promising platform for buffer layers, high-k di electrics, and fundamental studies of heteroepitaxy.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | LaAlO3 Perovskite thin filmsAl2O3 (0001) substratePulsed laser deposition (PLD)2-dimensional growthAtomic force microscopy (AFM)X-ray photoelectron spectroscopy (XPS)Reflection high energy electron diffraction (RHEED) |
| Subjects: | Microstructure and Characterization Electronics |
| Divisions: | Nano-Structured Materials |
| Depositing User: | Ms Upasana Sahu |
| Date Deposited: | 22 Sep 2026 06:58 |
| Last Modified: | 22 Sep 2026 06:58 |
| URI: | https://cgcri.csircentral.net/id/eprint/5829 |
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