Reddy, Seelam Rangaswamy and Prasad, Velidandla Venkata Bhanu and Bysakh, Sandip and Shanker, Vishnu and Joardar, Joydip and Roy, Subir K (2019) Ferroelectric and piezoelectric properties of Ba0.85Ca0.15Ti0.90Zr0.10O3 films in 200 nm thickness range. Journal of the American Ceramic Society, 102 (3). pp. 1277-1286. ISSN 0002-7820

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Abstract

Lead-free piezoelectric Ba0.85Ca0.15Ti0.90Zr0.10O3 (BCZT) thin films were fabricated on Si/SiO2/TiO2/Pt (100) substrates following chemical solution deposition technique. Microstructure of the nano-sized BCZT particles crystallized in the thin film was thoroughly characterized. Ferroelectric, dielectric and piezoelectric properties of the films were investigated in detail. The BCZT films annealed at 800 degrees C temperature exhibited high remanent polarization of 25 +/- 1 C/cm(2), energy density of 17 J/cm(3), dielectric constant of 1550 +/- 50 and dielectric tunability of 50%. Converse piezoelectric coefficients (d(33)) obtained from piezo-response force microscopy (PFM) measurements on BCZT grains of different grain size (20-100 nm) distributed on the BCZT 700 film varied widely from 90 to 230 pm/V. The same for BCZT 800 measured on different grain size (30-130 nm) varied from 120 to 295 pm/V. These BCZT thin films with high dielectric, ferroelectric, and piezoelectric properties might be good alternative to the PZT films for thin film piezoelectric device applications.

Item Type:	Article
Subjects:	Electronics
Divisions:	UNSPECIFIED
Depositing User:	Bidhan Chaudhuri
Date Deposited:	19 Nov 2019 07:03
Last Modified:	19 Nov 2019 07:03
URI:	http://cgcri.csircentral.net/id/eprint/4655

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