Gangadharan, R and Murthy, C R L and Bhat, M R and Sen, A and Das, N and Seal, Anindita (2007) Embedded PZT wafer sensors for structural health monitoring. In: REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, 30 July - 4 August 2006, Portland, OR; United States.

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Abstract

Recent advances in structural integrity evaluation have led to the development of PZT wafer sensors (PWAS) which can be embedded or surface mounted for both acoustic emission (AE) and ultrasonic (UT) modes, which forms an integrated approach for Structural Health Monitoring (SHM) of aerospace structures. For the fabrication of PWAS wafers, soft PZT formulation (SP-5H Grade containing dopants like BA, SM, CA, ZN, Y and HF) were used. The piezoelectric charge constant (d33) was measured by a d33 meter. As a first step towards the final objective of developing Health monitoring methods with embedded PWAS, experiments were conducted on aluminum and composite plates of finite dimensions using PWAS sensors. The AE source was simulated by breaking 0.5mm pencil lead on the surface of a thin plate. Experiments were also conducted with surface mounted PZT films and conventional AE sensors in order to establish the sensitivity of PWAS. A comparison of results of theoretical and experimental work shows good agreement.

Item Type:	Conference or Workshop Item (Paper)
Additional Information:	REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION; Portland, OR; United States; 30 July - 4 August 2006
Subjects:	Electronics
Divisions:	Sensor and Actuator
Depositing User:	Bidhan Chaudhuri
Date Deposited:	06 Jun 2016 10:03
Last Modified:	06 Jun 2016 10:03
URI:	http://cgcri.csircentral.net/id/eprint/3478

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