Chakraborty, D and Mukerji, Joydeb (1980) Characterization of silicon nitride single crystals and polycrystalline reaction sintered silicon nitride by microhardness measurements. Journal of Materials Science, 15 (12). pp. 3051-3056. ISSN 0022-2461

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Abstract

Identification of alfa- and beta-phases of Si3N4 single crystals grown from Si melt could be made with the help of Vickers microhardness measurements. The effect of chemical additives, e.g. metallic Fe and BaF2, on the microhardness of Si3N4 was also determined. Different constants involved in the empirical Meyer relationship between load and indentation diameters could be correlated with the porosity and microhardness of Si3N4 single crystals and polycrystalline, reaction sintered Si3N4. © 1980 Chapman and Hall Ltd.

Item Type:	Article
Subjects:	Engineering Materials
Divisions:	UNSPECIFIED
Depositing User:	Bidhan Chaudhuri
Date Deposited:	24 May 2016 10:26
Last Modified:	24 May 2016 10:26
URI:	http://cgcri.csircentral.net/id/eprint/3402

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