Bhattacharyya, D and Chaudhuri, S and Pal, A K and Bhattacharyya, S K (1992) Some aspects of surface roughness in polycrystalline thin films: optical constants and grain distribution. Vacuum, 43 (12). pp. 1201-1205. ISSN 0042-207X

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Abstract

A modified formulation and new method have been suggested to derive meaningful information on the optical constants, grain size and grain distribution of polycrystalline thin films where surface roughness plays an important part through the contributions arising out of scattered transmission and diffuse reflection. It was observed that this method successfully described the experimental observations in polycrystalline CuInSe2 and CdSe films.

Item Type:	Article
Subjects:	Physical Properties
Divisions:	UNSPECIFIED
Depositing User:	Bidhan Chaudhuri
Date Deposited:	26 Nov 2013 09:31
Last Modified:	28 Feb 2016 16:11
URI:	http://cgcri.csircentral.net/id/eprint/2315

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