Das, S and Pal, P and Roy, S and Chakraboarty, S and Biswas, Prasanta Kumar (2002) 3-D mapping with ellipsometrically determined physical thickness/refractive index of spin coated sol-gel silica layer. Bulletin of Materials Science, 25 (6). pp. 557-560. ISSN 0250-4707

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Abstract

Precursor sol for sol-gel silica layer was prepared from the starting material, tetraethylorthosilicate (TEOS). The sol was deposited onto borosilicate crown (BSC) glass by the spinning technique (rpm 2500). The gel layer thus formed transformed to oxide layer on heating to 450degreesC for similar to30 min. The physical thickness and the refractive index of the layer were measured ellipsometrically (Rudolph Auto EL 11) at 632.8 nm. About 10 x 10 mm surface area of the silica layer was chosen for evaluation of thickness and refractive index values at different points (121 nos.) with 1 min gap between two points. Those data were utilized in the Auto-lisp programme for 3-D mapping. Radial distribution of the evaluated values was also displayed.

Item Type:	Article
Additional Information:	National Conference on Frontiers in Materials Science and Technology, INDIAN INST TECHNOL, KHARAGPUR, INDIA, FEB 22-23, 2002
Uncontrolled Keywords:	Sol-gel silica layer; Ellipsometric studies; Refractive index; Physical thickness; 3D-mapping
Subjects:	Engineering Materials
Divisions:	Sol Gel
Depositing User:	Bidhan Chaudhuri
Date Deposited:	22 Mar 2012 12:31
Last Modified:	22 Mar 2012 12:31
URI:	http://cgcri.csircentral.net/id/eprint/1330

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