 | Up a level |
Group by: Item Type | No Grouping
Number of items: 1.
Das, S and Pal, P and Roy, S and Chakraboarty, S and Biswas, Prasanta Kumar (2002) 3-D mapping with ellipsometrically determined physical thickness/refractive index of spin coated sol-gel silica layer. Bulletin of Materials Science, 25 (6). pp. 557-560. ISSN 0250-4707
