Karmakar, B and Heide, G and Frischat, GH (2004) Comparative atomic force and scanning electron microscopic studies disclosing nanocrystallinity in cordierite glass-ceramics : examples of surface modification. INDIAN JOURNAL OF PHYSICS AND PROCEEDINGS OF THE INDIAN ASSOCIATION FOR THE CULTIVATION OF SCIENCE-PART A, 78A (1). pp. 47-51. ISSN 0252-9262

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The atomic force microscopy (AFM), because of its unique features, can be used for a variety of applications and provides excellent research and development opportunities in the area of nanoscience and nanotechnology of glass and glass-ceramics. In this study, microscopic experiments have been carried out using both AFM and SEM on polished and etched as well as fracture cordierite glass-ceramic surfaces to unfold their comparative capabilities. Most importantly, it has been exhibited that the AFM is capable to ascertain single tiny crystallites originated at the beginning of crystallization of glasses before scanning electron microscope (SEM) or X-ray diffraction (XRD) detects them. AFM provides extraordinary two-dimensional (2D), three-dimensional (3D), and quick surface plot (QSP) formats of images with unobscured (since no coating is necessary) views of nanostructures rather than obscured (since conducting coating is essential for insulators such as glass and glass-ceramics) and only 2D microstructural profiles of SEM. Development of interatomic forces (extended up to tens to hundreds of angstorms from the sample surface) between the atoms of the very sharp tip (probe) and those of surface (sample) during measurement results in unprecedented resolution (similar to0.1 nm) of images in AFM. While SEM produces images (resolution similar to10 nm) based on secondary electron emission from the sample surface. By comparing the results with those of SEM experiments, the AFM is established as a simple and powerful technique for the characterization of nanostructures of glass-ceramics particularly of early stages of crystallization.

Item Type: Article
Additional Information: National Seminar on Science and Technology of Nanomaterials, JABALPUR, INDIA, MAR 06-07, 2003
Uncontrolled Keywords: atomic force microscopy (AFM); scanning electron microscopy (SEM); cordierite glass-ceramics
Subjects: Glass
Depositing User: Subhra Lahiri
Date Deposited: 25 Jan 2012 10:07
Last Modified: 25 Jan 2012 10:07
URI: http://cgcri.csircentral.net/id/eprint/503

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