Bera, B and Esther, A C M and Dey, A and Mukhopadhyay, Anoop Kumar (2016) Structural, optical and electrical properties of V2O5 xerogel thin films. Indian Journal of Physics , 90 (6). pp. 687-692. ISSN 0973-1458

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In the present work V2O5 xerogel thin films are deposited on quartz substrate by using a cost effective sol-gel based dip coating method. Films of thickness similar to 122, 224 and 284 nm are grown as the number of dipping varies from one to three. Phase analyses of the thin films are investigated by X-ray diffraction technique. The microstructural characterization is carried out by electron microscopy techniques. Crystalline, phase pure V2O5 thin films with uniform nanoporous microstructure are grown in the present work. Solar transmittance and reflectance of films are measured by UV-VIS-NIR spectrophotometer. The optical band gap, refractive index and extinction coefficient of the films are also evaluated. Further, the average solar absorptance and IR emittance are evaluated by solar spectrum reflectometer and emissometer, respectively. The solar transmittance and optical band gap decrease with the increase in film thickness from 122 to 284 nm while reverse trend is observed for solar absorptance. Refractive index (similar to 1.95) and IR emittance (similar to 0.75) of the nanoporous V2O5 xerogel thin films on quartz substrate are almost independent of film thickness. The sheet resistance value slightly decreases from similar to 1.6 x 10(6) to similar to 2.6 x 10(5) ohm/cm(2) as the thickness of the V2O5 xerogel thin film increases from 112 to 284 nm.

Item Type: Article
Subjects: Engineering Materials
Divisions: Non-Oxide Ceramics & Composites
Depositing User: Bidhan Chaudhuri
Date Deposited: 10 Nov 2016 07:33
Last Modified: 10 Nov 2016 07:33

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