Guttler, B and Dewing, H L and Basu, Rajendra Nath and Schiel, D (1995) Quantitative-evaluation of the oxygen-content in YBa2Cu3O7-delta epitaxially grown thin-films using near-infrared excited Raman-spectrometry. Physica C-Superconductivity and its Applications, 251 (1-2). pp. 165-170. ISSN 0921-4534

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Abstract

The oxygen content of YBa2Cu3O7-delta epitaxially grown thin films can be quantitatively evaluated from variations of the scattering efficiencies of lattice vibrations as measured by near-infrared excited Raman spectrometry. An empirical procedure allows an accurate (< +/- 0.03 delta for delta less than or equal to 0.42), absolute and non-destructive measurement to be made to a spatial resolution in the micrometer range under ambient conditions, without reference measurements or special sample preparation and on a short time scale. The method is independent of kinetic ordering effects and laser-induced photoconductivity.

Item Type:	Article
Subjects:	Electronics
Divisions:	UNSPECIFIED
Depositing User:	Bidhan Chaudhuri
Date Deposited:	21 Aug 2012 07:34
Last Modified:	23 Mar 2016 12:31
URI:	http://cgcri.csircentral.net/id/eprint/1743

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